GageView Pro & GageView Interface Programs

 

GageView Pro & GageView Interface Programs

 

 

Panametrics-NDT™ has recently released the Windows-based GageView™Pro and GageView Interface programs that collect, create, print, and manage data. GageView Pro, designed to help users optimize both flaw detector and thickness gage information, manages data from Panametrics-NDT EPOCH 4, EPOCH 4B, EPOCH 4PLUS, and EPOCH LT flaw detectors and MG2-DL thickness gage. GageView manages data from MG2-DL thickness gage.

 

The GageView and the GageView Pro Interface programs are especially suited to the following tasks:

 

 

GageView Pro

GageView

Management of Instrument Calibration

Storage of Inspection Data

Thickness Surveys

Report Generation

Structural Weld Inspection (AWS)

 

Spotweld Inspection

 

DGS / AVG Inspection

 

Encoded B-Scans

 

 

GageView and GageView Pro include the following capabilities:

  • Creating Datasets and Surveys

  • Editing stored data

  • Viewing Dataset and Survey file information including thickness readings, gage setup values, and transducer setup values

  • Downloading and uploading Thickness Surveys

  • Exporting Surveys to spreadsheets and other programs

  • Collecting snapshot screens

 

The GageView and GageView Pro Interface programs require computer system features such as: Industry Standard Architecture (ISA), a SVGA or higher resolution monitor, a 486 or higher microprocessor, and a USB port.

Information management capabilities are fully screen accessible. For example, the Create New Database screen, shown below, allows the user to name a new database, browse for an existing database, and choose an appropriate database or devise type through an easy-to-use menu.

 

 

For most activities, operation continues through step-by-step procedures that are both resource efficient and straightforward. The ID Generation screen below provides the user with clear information requirements.

 

 

 

The creation and the management of reports are equally easy and screen-driven, as shown in the Reports screen below: