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Get statistics
(min, max, average, standard deviation) for the entire scan.
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Get statistics for
a selection of the data (mouse select on the C-Scan the area of interest).
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Re-compute
thickness with new velocity (per channel, per gate).
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Set data
boundaries, filter data and remove uniform coating thickness.
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Get data
distribution graph with statistics including design values indicators, min, max
indicators etc.
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Remove
a uniform coating from any C-Scan per gate or from the entire data.
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.Units change (metric, english).
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.Change gates size
without RF save! (Thickness Limits).
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.Filter data (NRI).
Filters can even be geometric (filter-out a certain area).
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.Delete Data.
Completely removes the data.